Desktop Scanning Electron Microscope JEOL JSM-7000
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Mark/Model
JSM-7000
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Year of release
2024
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Quantity
1
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Country of origin
Japan
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Types of work
High-resolution surface imaging at micron and submicron scale; Morphological and topographical structure analysis; Elemental composition mapping (using EDS system); Measurement of particle size, porosity, microcracks, interfaces.
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Main technical characteristics
Features: -versatility of use in various fields of science and industry; -compactness and speed of microstructural studies and their analysis; -no need for complex sample preparation; -low vacuum support; -built-in EDS for elemental analysis; Features: -Magnification: from 10x to 100,000x; -accelerating voltage: 5, 10, 15 kV; -observation modes: backscattered electrons, secondary electrons; -low vacuum: yes (backscattered electrons); -electron source: tungsten cathode/ Venelt cylinder; -slide table: motorized X (40 mm) and Y (40 mm) axis control; -maximum sample diameter: 80 mm; -maximum sample height: 50 m;
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Scope of application
The electron microscope is widely used in metallography and fractography, and it is indispensable in the study of complex-alloy steels, including iron, chromium and non-chromium compounds, and elemental composition mapping. Optional low vacuum equipment for the study of living organisms, plants, polymers, minerals, as well as food products.
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Operating instructions
present
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Name of the organization
НЕКОММЕРЧЕСКОЕ АКЦИОНЕРНОЕ ОБЩЕСТВО КАЗАХСКИЙ НАЦИОНАЛЬНЫЙ ИССЛЕДОВАТЕЛЬСКИЙ ТЕХНИЧЕСКИЙ УНИВЕРСИТЕТ ИМЕНИ К.И. САТПАЕВА
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Scope of application
Technical and engineering sciences
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City
Almaty
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Type of infrastructure
Scientific, educational
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Infrastructure subtype
Science Laboratory
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Laboratory
Research laboratory of construction and building materials “TECHNOPARK STROYTECH”
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Phone number
87085550480
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Email
technopark.stroytech@satbayev.university